transientenhanceddiffusion

由JMPoate著作·1995·被引用31次—ExperimentalandtheoreticalstudiesarepresentedwhichhelpelucidatethemechanismsoftransientenhanceddiffusionofBinSifollowingionimplantation ...,...TransientEnhancedDiffusion...Ionimplantationtechnologyinducesiliconlatticedamagecausingtransientenhanceddiffusion(TED)byreleasingexcesspoint ...,由SCJain著作·2002·被引用299次—Theenhanceddiffusionistemporary,onannealingthesa...

Ion implantation and transient enhanced diffusion

由 JM Poate 著作 · 1995 · 被引用 31 次 — Experimental and theoretical studies are presented which help elucidate the mechanisms of transient enhanced diffusion of B in Si following ion implantation ...

離子佈植損傷對摻雜擴散之影響

... Transient Enhanced Diffusion ... Ion implantation technology induce silicon lattice damage causing transient enhanced diffusion (TED) by releasing excess point ...

Transient enhanced diffusion of boron in Si

由 SC Jain 著作 · 2002 · 被引用 299 次 — The enhanced diffusion is temporary, on annealing the sample a second time after saturation, enhanced diffusion does not occur. It is therefore ...

Transient-enhanced diffusion in shallow

由 AT FIORY 著作 · 被引用 8 次 — The B and P species exhibit tran- sient-enhanced diffusion (TED) caused by transient excess populations of Si interstitials. The electrically activated fraction ...

Physical mechanisms of transient enhanced dopant ...

由 PA Stolk 著作 · 被引用 891 次 — Implanted B and P dopants in Si exhibit transient enhanced diffusion TED during annealing which ... keV 10B before and after transient enhanced diffusion at 800 ° ...

Model for Transient Enhanced Diffusion of Ion

We obtained experimental transient enhanced diffusion profiles of boron, arsenic, and phosphorous over a wide range of process conditions. We analyzed these ...

4.3.3 Transient Enhanced Diffusion

Generally, enhanced diffusion is caused by point defects above the thermodynamic equilibrium. The large amount of excess point defects increases the dopant's ...

Impact of low-temperature transient

由 B Baccus 著作 · 1992 · 被引用 15 次 — Abstract. Transient-enhanced diffusion due to annealing of ion-implantation damage is analysed as a function of temperature. In particular, the considerable ...

Enhanced Diffusion

TED is the rapid, damage-enhanced diffusion of dopants in silicon that occurs in the first anneals following ion implantation. The instantaneous enhancement in ...

DiffPDF 2.0.0 - PDF檔案內容比對工具

DiffPDF 2.0.0 - PDF檔案內容比對工具

程式人員有時候會了除錯,會利用工具比對檔案的文字內容,差異的部分一看就知道,當然這樣的比對還有很多用途,譬如說文件的傳遞當中,資料可能會增減,每一次重頭看起也很費時,不如直接比對有差異的部分!以前...